Category : Optical Test & Measurement
MAP-300 Multiple Application Platform
Third-Generation Modular Optical Test Platform for Scalable Lab and Manufacturing Applications
The MAP-300 is a high-performance, modular optical test and measurement platform designed for cost-effective development and manufacturing of optical communication technologies. It combines scalability, multi-user accessibility, and a wide range of hot-swappable modules to support diverse testing re...
Product Details
The MAP-300 is a third-generation modular optical test platform designed for both lab research and high-volume manufacturing. It features a flexible architecture with support for various optical modules, enabling applications like DWDM testing, OSNR measurement, and loss validation. With strong scalability and backward compatibility, it protects existing investments while supporting future upgrades. Its web-based interface allows remote multi-user access, and built-in automation support (SCPI, LXI) along with hot-swappable modules ensures efficient, reliable operation in modern test environments.
The platform supports an extensive portfolio of hot-swappable modules that fit into MAP-300 cassettes, including:
- Laser & Light Sources: mTLS (tunable laser), mTLG (DBR laser), mBBS (broadband source), mSRC (fixed wavelength sources)
- Amplification: mEDFA (Erbium Doped Fiber Amplifier)
- Signal Conditioning: mVOA (variable attenuator), mVBR (back reflector), mTFX (tunable filter), mPCX (polarization control)
- Passive & Utility: mUTL (couplers, splitters, mux/demux)
- Switching & Routing: mOSW/mISW (optical switches), mOSX (optical matrix switch)
- Measurement & Analysis: mOPM (optical power meter), mHROSA (high-resolution OSA), mOSA (spectrum analyzer), mORL (insertion loss/return loss test module)